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Microscopic Identification of Electronic Defects in Semiconductors: Symposium Held April 15-18, 1985, San Francisco, California, U.S.A (Materials)
by: Noble M. Johnson, Stephen G. Bishop, George D. Watkins

Used Price: Â£6.79

Binding: Hardcover
Dewey Decimal Number: 621.38152
EAN: 9780931837111
ISBN: 0931837111
Label: Materials Research Society
Manufacturer: Materials Research Society
Number Of Pages: 604
Publication Date: 1985-09
Publisher: Materials Research Society
Studio: Materials Research Society

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